SEMI Hosts Test Advisory Group Workshop


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SEMI Hosts Test Advisory Group Workshop

Seeking input and direction from the Test, Assembly, and Packaging industry segments, SEMI brings executives and thought leaders together to define challenges, opportunities, and the best paths for SEMI support.

On January 22, 2008, SEMI brought together members and non-members from a cross section of the test, assembly, and packaging communities. Representatives from fabless companies, independent device manufacturers, subcontractors, electronic design automation, and assembly test equipment segments were present to help identify possible SEMI initiatives to help further the ATP industry. As with many other SEMI industry efforts, these discussions were pre-competitive explorations of future directions, so concerns about antitrust issues were clarified and prevented by careful scoping of the agenda and the discussion content.

The agenda for this meeting centered on defining the issues faced by these executives and thought leaders, and were summarized in the question: “What keeps you awake at night?” By identifying the major issues faced by the industry, SEMI would gain a fuller and deeper understanding of the most significant contributions that an industry association could make to the strategic value of its members in these markets.

The meeting started out with industry consultant Ron Leckie of Infrastructure Advisors presenting economic trends of semiconductor price pressures, growth and a research and development funding gap. Next, Brad Robbins of Teradyne shared the outcome of a recent ITRS Test Workgroup meeting held in Japan, and then a round-table discussion began with each member sharing his or her ideas.

At the end of the round-table, five major concerns arose that can be summarized as Interface standards, a greater focus in the academic world to boost the test profession, Infrastructure standards, Yield Improvement, and a convergence of Protocol testing.

SEMI will assess the recommendations and respond to the workshop attendees with proposed next steps. A brief follow-up meeting of the workshop participants, as a steering committee was scheduled around SEMICON West in July, 2008.

Workshop participants included:

Advantest

Paul Roddy

OAI Technical Manager

Amkor

Seyed Paransun

VP, Test

ASE

Paul Domino

Director of Test Strategy

Cadence

Sanjiv Taneja

VP, Research & Development

Credence

Ben Brown

VP, Engineering

Intel

John Morrissey

Sort Manager, Intel Test Operations

LSI

Scott Keller

VP, Product Engineering and Development,

   

Network & Storage Products Group

LTX

Steve Wigley

VP, Product Marketing

Mentor Graphics

Greg Aldrich

Marketing Director, DFT Products

Qualcomm

Octavio Martinez

Director, Test Engineering

Roos Instruments

Mark Roos

President

STATS ChipPAC

Karl Stuber

Senior Manager, Test Product Line

Teradyne

Brad Robbins

VP, Strategic Planning Group

Verigy

Debbora Ahlgren

VP, Chief Marketing Officer

Facilitated by Ron Leckie (INFRASTRUCTURE Advisors), the workshop also included SEMI staff:

Stan Myers (President and CEO); Fred Kolbe (Europe); Saw Biing Huei (Singapore); Jonathan Davis, Pat Gardner, Dan Martin, and Tom Salmon (Headquarters).

Posted March 3, 2008