JACKIE FERRELL, TEAM OF MUTAZ HADDADIN AND SHOJI KOMATSU HONORED WITH 2010 SEMI KAREL URBANEK AWARD
SAN FRANCISCO, Calif. – July 13, 2010 – SEMI today announced that
Ms. Jackie Ferrell and the team of Mutaz Haddadin and Shoji Komatsu are the recipients of the 2010 Karel Urbanek Award for outstanding contributions to the development of standards for the semiconductor and related industries. The awards were bestowed during a reception held on the opening day of SEMICON West 2010.
The Karel Urbanek Memorial Award, the highest Standards honor bestowed by SEMI, is awarded to individuals who have made significant contributions to the SEMI International Standards program and to the development of semiconductor and FPD industry standards. It is named in honor of the late Karel Urbanek, co-founder of Tencor Instruments, former member of the SEMI Board of Directors, and an instrumental leader of the SEMI Standards program.
As the recipient of the individual award, Ms. Ferrell was nominated for her significant contributions to the globalization of the SEMI Standards Program. Since 1997, she has served in many roles in the Information and Control Committee and Factory Integration Division, and as a Co-Chair of the North American Regional Standards Committee (NARSC). In addition, she has served as a member of the International Standards Committee since 2006.
“We are pleased to recognize Ms. Ferrell’s many years of work toward bridging cultural differences in the various International Standards groups,” said Stanley T. Myers, president and CEO of SEMI. “Her superb coordination and mediation skills, combined with her technical expertise, resulted in the I300I/J300 framework, which played a key role in motivating suppliers to participate in standardization.”
Mutaz Haddadin and Shoji Komatsu has been nominated for their work in chairing the Physical Interfaces and Carriers (PIC) Committee’s International 450 mm Task Force, and introducing the first standards for wafer carriers and load ports to publication. Mutaz is a senior mechanical engineer at Intel and co-chair of the NA PIC Committee. Shoji is CEO of Acteon Corporation and co-chair of the Japan PIC Committee. Both have been active contributors to PIC for over six years.
“As the recipients of the team award for 2010, Mr. Haddadin and Mr. Komatsu have been instrumental in driving the 450 mm project and developing consensus with more than 100 task force members,” said Stanley T. Myers, president and CEO of SEMI. “On behalf of SEMI and its membership, I wish to extend warm congratulations to these two men for their tenacity and for their contributions to the group and the industry.”
Karel Urbanek Award recipients are selected by the International Standards Committee, which is the governing board for the SEMI Standards program. Nominations for other standards awards are made by the SEMI North America Standards staff and standards committee leaders, with the winners selected by a vote of the standards program members.
The SEMI Standards Program, established in 1973, covers all aspects of semiconductor process equipment and materials, from wafer manufacturing to test, assembly and packaging, in addition to the manufacture of flat panel displays and micro-electromechanical systems (MEMS). About 3,000 volunteers worldwide participate in the program, which is made up of 21 global technical committees. Visit www.semi.org/standards for further details about SEMI Standards.
SEMI is the global industry association serving the manufacturing supply chains for the microelectronic, display and photovoltaic industries. SEMI member companies are the engine of the future, enabling smarter, faster and more economical products that improve our lives. Since 1970, SEMI has been committed to helping members grow more profitably, create new markets and meet common industry challenges. SEMI maintains offices in Austin, Beijing, Bengaluru, Berlin, Brussels, Grenoble, Hsinchu, Moscow, San Jose, Seoul, Shanghai, Singapore, Tokyo, and Washington, D.C. For more information, visit www.semi.org.
James Amano/SEMI International Standards
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