Rich Interactive Test Database (RITdb)
- Focus: Develop the next-generation format following STDF to allow more flexibility in data types and support for adaptive test.
- RITdb enables a real-time streaming model that provides the ability to collect and monitor data/systems from sand to landfill
- Rationale: While Standard Test Data Format (STDF) is widely used in the semiconductor industry, there is a need for more efficient and flexible format to manage “big test data.”
Tester Event Messaging for Semiconductor (TEMS)
- Focus: Establish a vendor-neutral way to collect test cell data by standardizing ATE data messaging system based on industry-standard internet communication protocols between a test cell host and a server.
- Rationale: Address surging demand for real-time data analysis, real-time ATE input and control of the test flow to improve test yield, throughput, efficiency, and product quality.
Chip ID & Traceability
- Focus: develop a standardized approach for enabling traceable die-level identification (ID) throughout the IC manufacturing, test, and assembly processes to the point of use in the final system.
- Rationale: Many product types representing significant volumes that do not provide ID traceability. Without component-level traceability, it is extremely difficult to analyze failures and drive corrective action
Interested in becoming a CAST Member?
Contact Paul Trio for more information at: cast@semi.org