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July 10, 2024 - July 11, 2024

Test Vision Symposium

Test in the Semiconductor Future

Join us for the Test Vision Symposium in person event taking place on July 10-11 at SEMICON West 2024

Time

9:00 am - 5:00 pm

Location

Moscone Center
San Francisco, CA 94103
United States

Test Vision Symposium

See what's in store for SEMICON West 2024.  

The Test Vision Symposium is today's premier event for semiconductor and system test experts. It is organized with a vision towards the future of test, to discuss coming trends, innovations, and requirements.  

The symposium features keynote speakers, panel sessions, poster sessions, and a host of papers focused on industry trends, challenges, and solutions facing the test community. The symposium is co-located at SEMICON West and will be held as a hybrid event.

If you have questions, please contact the program manager and registration chair - Mayura Padmanabhan or Paul Trio from SEMI.

Agenda

The agenda for Test Vision Symposium 2024 will be published soon!

2023 Test Vision Agenda

Wednesday, July 12, 2023 Program

Welcome Session and Keynote

9:00 am - 9:10 am
Jeorge_Hurtarte_Teradyne
Jeorge Hurtarte
Senior Director, Product Marketing
Teradyne

Opening Remarks

9:10 am - 9:20 am
Alan_Liao_FormFactor
Alan Liao
Director, Business Development
Form Factor

Program Review

9:20 am - 9:50 am
Paul_Berndt_Microsoft
Paul Berndt
Principal Test Engineer
Microsoft Corporation

Best Paper of 2022 Award Presentation

9:50 am - 10:45 am
Regan Mills
Regan Mills
Vice President
Teradyne

Keynote: Semiconductor Manufacturing Symbiosis

Session 1: Data Analysis and Management in Test

Rich_Dumene_TexasInstruments
Rich Dumene
Principal Test Architect
Renesas

Session Moderator

10:50 am - 11:15 am
Bob Bartlett
Director of Test Technology
Advantest

High Performance Compute Devices and the Road to 2,000A

11:15 am - 11:40 am
Alan Hart
Sr. Director, R&D
Advantest

Enhanced Parametric Test Insights through Dynamic Data-driven Test Flow Execution

11:40 am - 12:05 pm
Ken_Butler_Advantest
Ken Butler
Sr. Director of Business Development
Advantest

Experiences Building and Deploying Real-Time Data Infrastructure into Test Operations

12:05 pm - 12:30 pm
Martin_Stadler_Teradyne
Martin Stadler
Europe Field Application Manager
Teradyne

Best Practice for Handling Large Digital Content in Git Repositories

12:30 pm - 1:30 pm

Lunch Break & Session 1 Raffle

Session 2: Emerging Technologies for Test

Ken-Lanier
Ken Lanier
Director of Strategic Development
Teradyne

Session Moderator

1:30 pm - 1:55 pm
Keith Schaub
Vice President of Technology and Strategy
Advantest

The Future is Here: GPT-4 as an Expert Assistant for Test and Product Engineers

1:55 pm - 2:20 pm
Jack DeGrave
Director of Quantum & Cryogenic Applications
FormFactor

Quantum and CryoCMOS: Enabling the Future of Computing with Advanced Test & Measurement Tools

2:20 pm - 2:45 pm
Higor Batagin
Sales Manager, Semi & MEMS Business Unit
SPEA

Industry 4.0 boosts predictive maintenance for semiconductor testers

2:45 pm - 3:10 pm
Richard Fanning
Software Architect
Teradyne

Embedding Analog Functionality into Protocol Testing Significantly Improves Debugability

3:10 pm - 3:15 pm

Closing Remarks & Session 2 Raffle

3:15 pm - 5:00 pm

Reception and Poster Sessions

Alan_Liao_FormFactor
Alan Liao
Director, Business Development
FormFactor

Session Moderator

Poster Presentations

PASCAL
Pascal Pierra
Sr. Vice President GM Instrumentation
AEM

Application specific solutions to address today's test challenges

Yue Chen
Sr. Application Engineer
Advantest

Deploying a MATLAB Application onto the ACS Real-Time Data Infrastructure

Dave Armstrong Advantest
Dave Armstrong
Principal Test Strategist
Advantest

How Good is Known Good? Design to Test Innovation

Simon Leigh
Vice President of Engineering
Elevate Semi

Reducing cost of Test: Innovating the Future of Test through ATE specific Ics

Vladimir Kraz
President
OnFILTER

Electromagnetic Interference – Overcoming Challenges for Semiconductor and Electronics Mfg

David Keezer
Chair Professor
Eastern Institute for Advanced Study

Terahertz ATE Vision 2030

Manuel Rei
Semiconductor Industry Solution Experience Director
Dassault Systemes

Requirements driven semiconductor verification

Marc_Hutner_proteanTecs
Marc Hutner
Sr. Director of Product Marketing
proteanTecs

Realtime Deep Data Adaptive Testing for Die-to-Die Interfaces

Sandeep Achari
Vice President, Global Key Accounts
Soliton

Interactive Protocol Analyzer for Digital Protocol Signal Validation

Close of Day 1

Thursday, July 13, 2023 Program

9:00 am - 10:00 am

Keynote: IEEE Heterogeneous Roadmap Integration

Session 3: Innovations in Test and Validation for Advanced Semiconductor technologies

Adrian_Kwan_Advantest
Adrian Kwan
Sr. Business Development Manager
Advantest

Session Moderator

10:00 am - 10:25 am
Daniel Bock
RF Applications Engineer
FormFactor

Production Test RF Calibration Methods for Probe Cards

10:25 am - 10:50 am
Charles_Watson_ISELabs
Charles Watson
Technical Staff
ISE Labs

ATE latch-up testing of real world, high power devices

10:50 am - 11:15 am
Jack Arnold
Chief Engineer
National Instruments

Getting the Straight Story: Approaches to Linearity Measurements for ADCs

11:15 am - 11:40 am
Lauren Getz
Product Manager
Teradyne

Emerging PMIC Trends Demand Test Innovations

11:40 am - 1:00 pm

Lunch Break and Session 3 Raffle

Session 4: Enabling Future Test Enhancements

Stuart_Pearce_AEM
Stuart Pearce
Sr. Director, Field and Product Marketing
AEM

Session Moderator

1:00 pm - 1:25 pm
Michael Braun
Product Marketing Manager
Advantest

HVM test of UCIe-enabled chiplets for 2.5D and 3D devices: The case for a dedicated test port

1:25 pm - 1:50 pm
Cameron Harker
Sr. Director of Product Marketing & Business Development
FormFactor

Advancing Probe Card Parallelism for SOC Devices

1:50 pm - 2:15 pm
Rainer Fink
Associate Professor
Texas A&M University

Mixed-Signal Test Workforce Development - An analysis of the Test Program at TAMU

2:15 am - 2:40 pm
Saravana Kumar Muthusamy
Product Manager
Soliton

Enabling comprehensive, ATE class, high-performance protocol validation on the bench

2:40 pm - 3:00 pm

Break & Session 4 Raffle

Panel Session

3:00 pm - 4:00 pm

From Assembly line to field: The future semiconductor testing

Anne Meixner
Consulting Technical Editor
SEMI-MAGS

Panel Moderator

Mark Hutner
Sr Director of Product Marketing
proteanTecs

Panelist

Dave Armstrong Advantest
Dave Armstrong
Principal Test Strategist
Advantest

Panelist

Panelist

Panelist

Closing Remarks & Symposium Raffle

Seminar with people

Test Vision Symposium is the premier event for semiconductor and system test experts, organized with a vision towards the future of test, to discuss upcoming trends, innovations, and requirements. It gathers an elite group of providers and users of test IP and equipment, to hear and engage with leaders in the field. You'll meet, learn, and network with 100+ participants in the field of test. Held in conjunction with SEMICON West assures access to a wide range of expertise and experience.

Test Vision is made possible due to our corporate sponsors, press partners and other partners mentioned below as well as our team of volunteers in the program committee and steering committee.

 

REGISTER TODAY

Seminar with people

Sponsors

2024 Partner Sponsors

Advantest Logo
Chroma ATE Logo
Laser Thermal Logo
Teradyne logo

2024 Associate Sponsors

FormFactor
Siemens
SPEA_TestVision

2024 Supporter Sponsors

AEM
Roos Instruments

Interested in becoming a 2024 Test Vision Symposium sponsor? Download the form here.