MICRONICS JAPAN CO., LTD.
Jan 1, 1985
2193
Development, manufacturing, and sales of semiconductor testing unit, semiconductor testing system and LCD testing system.
Primary Industry
Semiconductor
Primary Product Category
Equipment and Sub-Systems
Primary Product Sub Category
Test Equipment
Keywords
probe card, wafer prober, package probe, test socket, semiconductor tester, FPD lighting unit, probe unit
Website
吉祥寺本町2-6-8
武蔵野市
180-8508