Test Vision Symposium Best ATE Paper Award
To spotlight advances in ATE TestVision and the Test Technology Technical Council (TTTC) created the Best ATE Paper Award. The purpose of this award is to single out and publicize the most influential ATE paper of the year to stimulate innovation in the ATE industry. The winner is announced at Test Vision at SEMICON West.
2023 Award Recipients for Best ATE Paper of 2022
“A Handler based Solution for 60 GHz AiP DUT Testing (and an early look at test results)” from TestConX
Authors: Brian C. Wadell, Jonathan Williams from Teradyne Innovation Labs
Best ATE Paper Award - 2024 Finalists
The finalists for the "Best ATE Paper of 2023" will be announced soon!
The Best ATE Paper Award Selection Committee appreciates and relies upon inputs from the technical community when naming the Best ATE Paper.
Past Award Recipients:
- 2023: TestConX - “A Handler based Solution for 60 GHz AiP DUT Testing (and an early look at test results)”, Brian C. Wadell and Jonathan Williams (Teradyne Innovation Labs)
- 2022: Semiconductor Engineering - "HSIO Loopback - The Challenges and Obstacles of Testing at 112 Gbps", Dave Armstrong (Advantest) and Don Thompson (R&D Altanova)
- 2021: TestConX2020 - "Socket Design and Handler Integration Challenges in Over the Air Testing for 5G Applications," Natsuki Shiota, Aritomo Kikuchi, Hiroyuki Mineo, Jose Moreira and Hiromitsu Takasu (Advantest)
- 2019: BiTS 2018 - "Innovative Approach to MEMS Contactor," Norihiro Ohta (Nidec-Read) and Pete Rogan (Nidec SV TCL)
- 2018: ITC 2017 - "Low Cost Dynamic Error Detection in Linearity Testing of SAR ADCs," Nimit Jain et al.
- 2017: ETS 2016 - "Test-station For Flexible Semi-Automatic Wafer-Level Silicon Photonics Testing," Jeroen De Coster et al.
- 2016: BiTS 2015 - "Designing Sockets for Ludicrous Speed (80 GHz)," Don Thompson and Jose Moreira. The authors showed how they constructed an interface for ATE capable of testing 80 GHz signals.
- 2015: ITC 2014 - "3A Novel RF Self TEst for a Combo SoC on Digital ATE with Multi-Site Applications," CH Peng, et al. The team showed how they used low cost ATE to test an extremely cost sensitive RFIC, while achieving the same bin results as a full performance, high cost ATE System.
- 2014: ITC 2013 - "30-Gb/s Optical and electrical Test Solution for High-Volume Testing," Daisuke Watanabe et al. The first paper presenting an optical-electrical test system suitable for production testing.
- 2012: I²MTC 2011 - "Reducing THD in an Audio Test Instrument," Sol Max & Richard Liggiero. Awarded for its originality, innovation, intrinsic merit, and effective communication to the audience.
- 2011: ITC 2010 - "A High Desnity Small Size RF Test Module for High Throughput Multiple Resource Testing" (slides) the authors did an excellent job of integrating RF test instrumentation to achieve small packaging. The paper clearly explains the challenges faced, the approaches taken, and the results achieved. Any ATE engineer interested in building RF instrumentation will find this paper fascinating.
Award Selection Committee
- Paul Berndt (Chair), Microsoft
- Dave Armstrong, Advantest
- Dr. Erik Larsson, Lund University
- Adrian Carleton, NXP
- Ken Lanier, Teradyne
- Professor Gordon Roberts, McGill University
- Michael Peters, Elmos
The recipient(s) of the Best ATE Paper of 2022 award will be announced at the Test Vision Symposium @ SEMICON West 2023.