downloadGroupGroupnoun_press release_995423_000000 copyGroupnoun_Feed_96767_000000Group 19noun_pictures_1817522_000000Member company iconResource item iconStore item iconGroup 19Group 19noun_Photo_2085192_000000 Copynoun_presentation_2096081_000000Group 19Group Copy 7noun_webinar_692730_000000Path
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Members of Collaborative Alliance for Semiconductor Test (CAST) are recognized as leaders in the industry and work to identify and leverage industry trends to benefit all industry stakeholders.

STMicro Logo

Chris Portelli-Hale, Chair
Operational Programs Director, Front-End Manufacturing & Technology R&D
ST Microelectronics
Chris Portelli-Hale Photo
Advantest
Brian Buras
Senior Staff Consultant
Advantest
Brian Buras Photo
Advantest
Zhi-Jun Xue
Advantest
 
AEM
Mark Yaeger
President AEM International (U.S.)
AEM
 
AEM
Stuart Pearce
Senior Director Field and Product Marketing
AEM
 
Cohu Logo
Brian Bogie
Senior Director Product Marketing
Cohu
Brian Bogie Photo
Cohu Logo
Bill Fritzsche
Member Technical Staff
Cohu
Bill Fritzsche Photo
Cohu Logo
Peter Cockburn
Senior Product Manager - Test Cell Innovation
Cohu
Peter Cockburn Photo
Galaxy LogoWes Smith
VP Advanced Technology
Galaxy Semiconductor
Wes Smith Photo
 Maxim integrated logo
Brent Herzog
Principal Member of Tehcnial Staff, Test Technology Software 
Maxim Integrated

 

 

 

 Maxim integrated logo
Jason Theos
Test Technology Engineering and Software/R&D Technology Integration
Maxim Integrated
Jason Theos Photo
NI logo
Keith Arnold
VP Product Management
NI
Keith Arnold Photo
NI logo
Arik Peltz
Team Manager
Online Solutions
NI
Arik Peltz Photo
PDF Solutions Logo
Ken Harris
Director of Product Management
PDF Solutions
 
PDF Solutions Logo
Dave Huntley
Business Development
PDF Solutions
 
Roos Instruments
Mark Roos
CEO
Roos Instruments, Inc.
Mark Roos Photo
Teradyne LogoLaurent Bonneval
Production Integration Group - Software Team
Teradyne SAS
Laurent Bonneval Teradyne
TI logo
System Integration Engineer
Texas Instruments
Stacy Ajouri Photo