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July 12, 2022

Detection Limit Workshop SW 2022

Join this workshop during SEMICON West 2022 to explore SEMI C10 and discuss how its application to your procedures will improve your yields and manufacturing processes.  Quality experts, analytical experts, statisticians and those involved with product quality and process metrics should attend.

Time

10:00 am - 11:30 am

Add to Calendar 2022-07-12 10:00:00 2022-07-12 11:30:00 Determining the Detection Limit - SEMI C10 Join this workshop during SEMICON West 2022 to explore SEMI C10 and discuss how its application to your procedures will improve your yields and manufacturing processes.  Quality experts, analytical experts, statisticians and those involved with product quality and process metrics should attend. @ SEMICON WEST Moscone Center San Francisco, CA United States SEMI.org contact@semi.org America/Los_Angeles public
Location

@ SEMICON WEST
Moscone Center
San Francisco, CA
United States

Detection Limit Workshop SW 2022

In this workshop, our journey of navigating the detection limit obstacle course begins with a broad view of the problem focused on developing a conceptual understanding of key detection limit concepts and limitations. Statistics plays a key role in effective detection limit definition; but need to be the last and final piece of solving the detection limit puzzle where they drive the development of an appropriate statistical practice for detection limit standards.  

The current version of SEMI C10 - Guide for Determination of Method Detection Limits sets out important and useful guidance for these concepts. Key detection limit concepts, including the problems caused by our natural biases must be explored and understood. Issues in detection limit and rule-set application will be probed since it is at the application level that detection limit standards succeed or fail.

Workshop Agenda 

Part 1:  Detecting the Detection Limit – Broad View of Detection Limit Standards / Issues

  • The Swamp:  Why so much disagreement? 
  • Basic Detection Limit concepts
  • Calibration’s under-appreciated role
  • Detection Limit Quantification Uncertainty
  • DL Usage Contexts and Reporting Practices
  • What’s required to build a Detection Limit standard?

Part 2:  SEMI C10 – Guide for Determination of Method Detection Limits

  • How does it work? 
  • What does it assume?
  • What are its strengths and limitations?
  • How should Semi C10 derived Detection Limits be applied?
  • What form could an update to SEMI C10 take and why?

Featured Speakers

Thomas Bzik
Thomas Bzik
Statistical Methods Task Force Co- Leader
EMD Electronics

Registration Details

Registration is Required.  There are no fees.

If you are registering to attend the Workshop Virtually, please follow the same registration procedure (via the Button Below) and we will email you the Dial-In information a week before the session.

Registration for this Workshop is separate from SEMICON West registration, but necessary to access the workshop room.  To waive the SEMICON West Registration fee, use code "STANDARDSGUEST22" when registering on the SEMICON West Registration page

Questions?  Contact Laura Nguyen at lnguyen@semi.org.