CAST
SEMI Collaborative Alliance for Semiconductor Test develops, coordinates, and directs all SEMI services for the semiconductor test community. CAST members include a range of semiconductor industry leaders, from automated test equipment (ATE) companies to integrated device manufacturers (IDMs) to fabless manufacturers to outsourced semiconductor assembly and test (OSAT) companies.
- Participating CAST provides the opportunity to shape the future of semiconductor test through industry-wide collaboration.
- CAST members work with their customers, suppliers and industry colleagues to:
- develop industry standards that reduce costs and spur innovation,
- engage in valuable pre-competitive activities, and
- serve as industry-wide advocates for the test industry and profession.
- CAST members are recognized as leaders in the industry and work to identify and leverage industry trends to benefit all industry stakeholders.
About CAST
CAST is a SEMI Technology Community providing a collaborative technology platform where SEMI members in the ATE and test systems space can discuss issues and pre-competitively develop solutions that benefit the industry. CAST Overview.
A SEMI Technology Community
CAST was formed in 2008 by semiconductor device makers and test industry suppliers to engage in and resolve common industry issues related to higher test equipment utilization, lower costs, and greater return on investment. In 2009, CAST became a SEMI Technology Community. The founding supporters include Advantest, Amkor, Infineon, Intel, LTX-Credence, Qualcomm, Roos Instruments, Teradyne, and Verigy. Read More.
CAST activities currently include:
- Rich Interactive Test Database (RITdb)
- Tester Event Messaging for Semiconductors (TEMS)
- Device ID & Traceability
Members of Collaborative Alliance for Semiconductor Test (CAST) are recognized as leaders in the industry and work to identify and leverage industry trends to benefit all industry stakeholders. Read More
CAST Information
Publications
- Docking and Mounting Generic Terminology Guide (Published July 2012) Click here for free access to the guide.
- Published SEMI Standards
- SEMI G91-0513, Standard Test Data Format (STDF) Memory Fail Datalog
- SEMI T23-0119, Specification for Single Device Traceability for the Supply Chain
Featured Articles
- New ATE Standard Passes the Test [SEMI A4 TEMS] (March 2021)
- Why Data Format Slows Chip Manufacturing Progress (Semiconductor Engineering, October 2020)
- New Data Format Boosts Test Analytics (Semiconductor Engineering, September 2020)
- RITdb: The Interplanetary Database for Manufacturing (Jan 2019)
- Device Traceability and SEMI’s Single Device Tracking Initiatives (Dec 2018)
- SEMI Standards Guide Smart Supply Chain Traceability (Mar 2018)
- Improving Test Data Communication (Mar 2018)
- Semiconductor Test in the Information Age by Ron Leckie, a CAST member (Jan 2017)
- Enabling Industry Collaboration to Address Critical ATE Challenges (Aug 2016)
CAST Activities
- Rich Interactive Test Database (RITdb)
- Tester Event Messaging for Semiconductor (TEMS)
- Chip ID & Traceability
Events
- Test Vision Symposium - July 22-23, 2020 at SEMICON West (Virtual Event)
- CAST 2018 Workshop: "Improving Test Data Communication" - November 8 at SEMI Headquarters (Milpitas, CA)
Interested in becoming a CAST Member?
Contact Paul Trio for more information at: cast@semi.org