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Auxiliary Information
AUX001-0423
Title: List of Wafer Supplier Identification Codes
Committee: SEMI Standards Staff
Cost: No Charge
AUX002-0600
Title: An Overview of Factory Automation Requirements and Design
Committee: Information & Control
Cost: No Charge
AUX004-1100
Title: SEMI S2-0200 Fire Safety Evaluation Checklist for Semiconductor Equipment Using Hazardous Production Materials
Committee: EH&S
Cost: No Charge
AUX005-1101
Title: Comparison Matrix Between SEMI S2-93A and S2-0200
Committee: EH&S
Cost: As per Individual Standard
AUX007-0401
Title: Comparison between SEMI S2-93A and KOSHA S Mark
Committee: EH&S
Cost: No Charge
AUX010-0304
Title: User Interface Configurations For 300 mm Equipment Load Ports
Committee: Physical Interfaces & Carriers
Cost: No Charge
AUX013-0705
Title: 300 mm Equipment Supplier's Basic Operational Scenarios for Automation
Committee: Information & Control
Cost: No Charge
AUX014-0306
Title: List of Jig Supplier Identification Codes
Committee: SEMI Standards Staff
Cost: No Charge
AUX015-1106
Title: SEMI OCR Character Outlines
Committee: Silicon Wafer
Cost: No Charge
AUX016-0710E
Title: List of Carrier Maker Identification Codes
Committee: SEMI Standards Staff
Cost: No Charge
AUX017-0310E
Title: Contactless Carrier-Lifetime Measurement in Silicon Wafers, Ingots, and Blocks
Committee: Photovoltaic
Cost: No Charge
AUX018-0710
Title: FOUP/Load Port Interoperability Report
Committee: Physical Interfaces & Carriers
Cost: No Charge
AUX019-0211
Title: Research Report on Interlaboratory Study to Establish Precision Statements for SEMI PV1, Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry
Committee: Photovoltaic
Cost: No Charge
AUX020-0211
Title: List of Authentication Service Body (ASB) Identification Code for SEMI T20, Specification for Authentication of Semiconductors and Related Products
Committee: Traceability
Cost: No Charge
AUX021-0611
Title: Electrostatics Guide
Committee: Metrics
Cost: No Charge
AUX022-0611
Title: Conversion of Units for Impurity Concentrations in Silicon
Committee: Photovoltaic
Cost: No Charge
AUX023-0915
Title: Overview Guide to SEMI Standard for 450 mm Wafers
Committee: Physical Interfaces & Carriers
Cost: No Charge
AUX024-0712
Title: List of Photovoltaic and Semiconductor Shared Gases and Liquid Chemical Standards
Committee: Photovoltaic - Materials
Cost: No Charge
AUX025-0615
Title: List of Identification Codes of Suppliers of SI Bricks, SI Wafers and Photovoltaic C-SI Solar Cells for Use in the PV Industry
Committee: Photovoltaic - Automation
Cost: No Charge
AUX026-1012
Title: Research Report on Interlaboratory Study to Establish Precision Statements for SEMI PV13, Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor
Committee: Photovoltaic - Materials
Cost: No Charge
AUX027-0213
Title: Results of Round Robin for SEMI PV10, Test Method for Instrumental Neutron Activation Analysis (INNA) of Silicon
Committee: Photovoltaic - Materials
Cost: No Charge
AUX028-0813
Title: Interlaboratory Evaluation of Nondestructive Method for Measuring the Edge Contour of Silicon Wafers
Committee: Silicon Wafer
Cost: No Charge
AUX029-0214
Title: Interlaboratory Study to Determine Precision of Method 1 of SEMI MF673, Test Method for Measuring Resistivity of Semiconductor Slices of Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage
Committee: Silicon Wafer
Cost: No Charge
AUX030-0423
Title: Codes for Referencing Gases, Gas Mixtures and Vaporizable Materials Used in Digital Mass Flow Controllers
Committee: Gases
Cost: No Charge
AUX031-1114
Title: S2 Mapping into the Machinery Directive (2006/42/EC) Essential Health and Safety Requirements
Committee: EH&S
Cost: No Charge
AUX032-0715
Title: Round Robin Study of Method for Measurement of Voids in Bonded Pairs of Silicon Wafers
Committee: 3D-IC
Cost: No Charge
AUX033-0617
Title: 450mm PIC Interoperability Report
Committee: Physical Interfaces & Carriers
Cost: No Charge
AUX034-0519
Title: Round-Robin Testing of Sample Preparation Methods for Minority Carrier Diffusion Length Measurements by Surface Photovoltage Methods
Committee: Silicon Wafer
Cost: No Charge