Holon Co. Ltd.
Jan 1, 1986
13496
Analysis/Measurement: Defect Detection, SEM.
Primary Industry
Semiconductor
Primary Product Category
Equipment and Sub-Systems
Primary Product Sub Category
Metrology/Inspection
Keywords
CD-SEM, DR-SEM, Photomask CD-SEM, SEM
Website
上砂町5-40-1
立川市
190-0032