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The Gigafab Minute and SEMI Standards: A Modern Miracle

Even for someone who has been in this industry since the days of the TI Datamath 4-function calculator and the TMS1100 4-bit microcontroller (yes, that’s been a LONG time – the movie Grease premiered the same year!), it is sometimes hard to grasp the scope and complexity of what happens...

Meeting Metrology and Inspection Requirements as EUVL Ramps Up for 5nm and 3nm

The Advanced Lithography TechXPOT at this year’s SEMICON West will explore progress in extreme ultraviolet lithography (EUVL), its economic viability for high-volume manufacturing (HVM) and other lithography solutions that will address the march to 5nm and onward to 3nm.As a prelude to the event,...

Process Complexity Means Exponentially Increasing Data Volumes and Analysis Challenges

What’s next for smarter, more connected electronics manufacturing - Part 2The fast-maturing infrastructure now enabling applications for big data and artificial intelligence means disruptive change not just at individual companies but also in data connections among companies across the...

Directed Self Assembly (DSA) Plays Role in the March to 3nm

The Advanced Lithography TechXPOT at this year’s SEMICON West will explore progress in extreme ultraviolet lithography (EUVL), its economic viability for high-volume manufacturing (HVM) and other lithography solutions that will address the march to 5nm and onward to 3nm.As a prelude to the event,...

EUV Lithography: Extending the Patterning Roadmap to 3nm

This year’s Advanced Lithography TechXPOT at SEMICON West will explore the progress on extreme ultra-violet lithography (EUVL) and its economic viability for high-volume manufacturing (HVM), as well as other lithography solutions that can address the march to 5nm and onward to 3nm. Several session...